David M. Mills is a senior scientist with GE Global Research. He earned a B.S. degree in engineering from LeTourneau University, Longview, TX and a Ph.D. degree in biomedical engineering from Duke University, Durham, NC. In 2000, he joined GE as an ultrasound probes engineer, designing medical ultrasound transducers using PZFlex (now OnScale) simulations for both piezoelectric and cMUT based transducers. Another research interest is in new clinical applications for ultrasound that are enabled by real-time 3D ultrasound imaging, visualization algorithms, and customized user interfaces. Dr. Mills has over 25 issued patents and has authored more than 10 external publications. He is a member of the IEEE.
Receive IUS updates straight to your inbox!
© Copyright 2021 IEEE – All rights reserved. Use of this website signifies your agreement to the IEEE Terms and Conditions.
A not-for-profit organization, IEEE is the world’s largest technical professional organization dedicated to advancing technology for the benefit of humanity.
This site is created, maintained, and managed by Conference Catalysts, LLC. Please feel free to contact us for any assistance.
IEEE websites place cookies on your device to give you the best user experience. By using our websites, you agree to the placement of these cookies. To learn more, read our Privacy Policy.